Scott Lahteine 54f75ebbfe Rename platform, part 2		2019-12-03 06:42:49 -06:00
..
ARMED-tests
at90usb1286_cdc-tests
at90usb1286_dfu-tests
BIGTREE_BTT002-tests
BIGTREE_SKR_PRO-tests
DUE-tests	LULZBOT_TOUCH_UI => TOUCH_UI_FTDI_EVE	2019-11-23 17:04:17 -06:00
esp32-tests	Fix ESP32 name conflict	2019-10-15 17:13:07 -05:00
FYSETC_F6_13-tests	Rename platform, part 2	2019-12-03 06:42:49 -06:00
jgaurora_a5s_a1-tests
linux_native-tests
LPC1768-tests
LPC1769-tests	Fix LPC1769 test	2019-10-24 11:55:48 -05:00
megaatmega1280-tests
megaatmega2560-tests	Tweak test labels	2019-12-01 21:12:38 -06:00
mks_robin_lite-tests
mks_robin_mini-tests
mks_robin_nano-tests
mks_robin-tests
rambo-tests
run_tests
SAMD51_grandcentral_m4-tests
sanguino_atmega644p-tests
sanguino_atmega1284p-tests
STM32F4-tests
STM32F7-tests
STM32F103CB_malyan-tests
STM32F103RC_bigtree_USB-tests	Revert default BTT STM32F103 environment (#16006)	2019-11-26 04:28:13 -06:00
STM32F103RC_bigtree-tests	Revert default BTT STM32F103 environment (#16006)	2019-11-26 04:28:13 -06:00
STM32F103RC_fysetc-tests
STM32F103RE_bigtree_USB-tests	Reorder F103RE environments (#16054)	2019-12-01 13:17:45 -06:00
STM32F103RE_bigtree-tests	Reorder F103RE environments (#16054)	2019-12-01 13:17:45 -06:00
STM32F103RE-tests
STM32F103VE_longer-tests
STM32F407VE_black-tests
teensy31-tests
teensy35-tests